Special invited speaker

1. Conference: European BioImage Analysis Symposium (EUBIAS 2015) 
   Carolina Wählby 
   Date: 20150105-20150106 
   Address: Institut Curie, Paris, France 
   Title: Analysis of microscopy data using CellProfiler and CellProfiler Analyst

2. Conference: IEEE EMBS Chapter in Kerala meeting 
   Ewert Bengtsson 
   Date: 20150304-20150304 
   Address: CDAC, Thiruvananthapuram, Kerala, India 
   Title: Medical image analysis - the key to personalized medicine?

3. Conference: Digikult - Digitalt kulturarv i praktiken [Digital culture inheritance in practice] 
   Anders Brun 
   Date: 20150325-20150326 
   Address: Gothenburg, Sweden 
   Title: Storskalig Datautvinning från Historiska Handskrivna Texter (In Swedish)

4. Conference: HIMA Imaging Science and International Imaging 
   Ewert Bengtsson 
   Date: 20150505-20150507 
   Address: Wyndham Grand Downtown, Pittsburgh, USA 
   Title: Will Digital Pathology Bring Computer Assisted Pathological Diagnostics into Routine Medical Care? 
   Comment: This workshop was part of the 2015 Pathology Informatics Summit

5. Conference: Scandinavian Conference on Image Analysis (SCIA 2015) 
   Carolina Wählby 
   Date: 20150615-20150617 
   Address: IT University of Copenhagen, Denmark 
   Title: Image based drug discovery - challenges and opportunities at the microscopy scale.

6. Conference: 14th International Congress on Stereology and Image Analysis (14th ICSIA) 
   Cris Luengo 
   Date: 20150707-20150710 
   Address: Liege, Belgium 
   Title: Estimating length distributions 

7. Conference: Swiss Image-Based Screening Conference 2015 
   Carolina Wählby 
   Date: 20150930-20151001 
   Address: Novartis Learning Center Horburg, Basel, Switzerland 
   Title: Fishing out relevant information from large scale experiments

8. Conference: International Conference on Image Processing Theory, Tools and Applications (IPTA 2015) 
   Joakim Lindblad, Nataša Sladoje 
   Date: 20151110-20151113 
   Address: Orleans, France 
   Title: High-resolution reconstruction by feature distance minimization from multiple views of an object